August 22, 2020
Photometric and Colorimetric Evaluation of LED Chip Scale Packages by Utilizing
Photometric and Colorimetric Evaluation of LED Chip Scale Packages by Utilizing a Step-Stress Accelerated Degradation Check (SSADT) Methodology. By fixing the issue of very lengthy check time on reliability qualification for Gentle-emitting Diode (LED) merchandise, the accelerated degradation check with a thermal overstress at a correct vary is thought to be a promising and efficient strategy. For a complete survey of the appliance of step-stress […]
